This project introduces a bimodal Atomic Force Microscopy (AFM) approach to quantitatively map van der Waals (vdW) forces at the nanoscale, addressing key challenges in 2D material and device optimization. Unlike conventional optical or electrical methods, this technique provides direct, high-resolution measurements of vdW interactions on a pixel-by-pixel basis.
By applying this method to vdW heterostructures and magnetic vdW materials, researchers will correlate nanoscale force variations with device performance metrics like charge transfer and magnetic anisotropy. The project also integrates AI-driven imaging to enhance interpretation, creating a comprehensive framework that links nanoscale vdW mapping with macroscopic device characteristics.
The expected impact includes improved material synthesis, defect identification, and fabrication optimization, benefiting applications in photodetectors, flexible electronics, and 2D magnetism. This approach sets a new standard for vdW characterization, offering insights that bridge fundamental physics with next-generation nanodevice engineering.